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https://doi.org/10.15414/2019.9788055220703

             4  International Scientific Conference                                            Abstracts Book
              th
             SCREENING OF WHEAT CULTIVARS WITH EFFECTIVE RESISTANCE GENES TO THE HIGH
                                       VIRULENT STRAIN OF STEM RUST UG99
             Svitlana Spivak, Yaroslav Pirko, Nataliya Kozub, Anastasiia Rabokon, Anatoliy Karelov,
                                   Bogdan Ivaschuk, Alla Yemets, Yaroslav Blume

                            Institute of Food Biotechnology and Genomics of the NAS of Ukraine,
                                      Kyiv, Ukraine; E-mail.: svetlana_spivak@ukr.net

                  Stem rust is a dangerous disease of such important cereals as wheat and barley, caused
            by  Puccinia  graminis  f.  sp.  tritici.  Among a large number of strains of this fungus, Ug99 is
            known as most devastating. Ug99 strain demonstrates high dynamics of distribution during
            the last decades and the ability to mutate. Main wheat stem rust resistance genes are not
            efficient against this strain. There are some foreign wheat varieties which provide resistance
            to Ug99, but their direct use is not possible in Ukraine because of agrotechnical
            characteristics. Therefore, it is very important to create the own Ukrainian wheat varieties
            with resistance to Ug99.
                  The main purpose of this work was to select the molecular-genetic markers for the
            detection resistance genes to  Ug99 strain of stem rust and  the selection of foreign wheat
            lines/varieties with effective resistance genes to strain Ug99 for  further transfer and
            pyramiding to modern Ukrainian  wheat cultivars. As a result,  the list of molecular-genetic
            markers for effective resistance genes to the Ug99 strain (namely Sr2, Sr33, Sr39, Sr40 genes)
            has been generated. This list included the  nucleotide primer sequences, the annealing
            temperature, the length of the expected amplicon, etc. Also, some of them can be used in the
            study of the allelic state of  resistance genes, for example csSr2, Sr39 # 22r, Sr39 # 50s,
            Wmc344, Gwm374.
                  The presence of resistance genes to Ug99 in domestic and foreign breeding wheat
            cultivars was determined using PCR. Genomic DNA from wheat seedlings was obtained using
            the CTAB method. After PCR amplification the products were analyzed on a non-denaturing
            acrylamide gel. A list of wheat cultivars of national and foreign breeding with resistance genes
            to the Ug99 that can be used for crossings was created. It consisted of 16 samples: (RL5711 x
            W984-8767), (RL6087 x W984-8767), DH31, (RL5711 x FL62R1), RL6087, RL5711, (RL6087
            x Hoffman), Selkirk, DK20, (RL5711 x  Carberry), (RL6087 x Carberry), Pembina, НК16 – the
            country of origin is Canada; Renown – the country of origin is United Kingdom; Kharkivska 6,
            Kharkivska 12 – the country of origin is Ukraine. In total among 16 tested specimens, it was
            found 13 which are characterized by the presence of resistant alleles of one or another Sr
            gene (Sr 2, Sr 33, Sr 39, Sr 40). Among the varieties of Ukrainian breeding (Kharkivska 6 and
            Kharkivska 12), involved in the study,  none resistance alleles of the studied  Sr  genes was
            showed.
            Keywords: wheat, stem rust, strain Ug99, resistance genes, PCR analysis.

            Acknowledgments: This work was particularly supported by the project of Ministry of Education and
            Science of Ukraine “Creation of selection lines of soft wheat with resistance genes to stem rust strain
            Ug99” (0117U006842).













           4  International Scientific Conference Agrobiodiversity Nutrition, Health and Quality of Human and Bees Life  |139
            th
                                               September 11–13, 2019
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